Intermittent Operating Life (IOL)

IOL testing is used to determine the reliability of devices, most commonly used on power electronics. Along with stressing the die, the integrity of the package is also tested. This ensures that the die is attached to the package securely and the bond wiring is robust. Cycling the device on and off replicates the thermo-mechanical stresses experienced in typical field conditions. The on and off cycles are repeated for a prescribed number of repetitions, often up to 5,000.

ORS offers capabilities to test diode and transistor devices in IOL testing. Test sets for common TO-220 and TO-247 devices are already developed and in use. Other package styles can easily be adapted with daughter cards or other mounting methods.