Electrical Testing
ORS offers custom board and socket design capabilities that enables us to be your one stop shop for electrical testing and biased aging, with data monitoring in situ available. Our custom boards can be used in tandem with our expansive environmental testing capabilities. Making possible for us to support biased low temperature, high temperature, high humidity, temperature cycling, and HAST testing.
With our expert engineering staff, you can be assured that your electrical testing will be performed properly and expeditiously.
Accelerated Bias Aging is used to determine the reliability and quality of semiconductor devices.
Capacitance and Dissipation Factor (C&DF) testing is used to determine the properties of a capacitor or insulating material.
Dielectric Withstanding Voltage (DWV) testing is used to ensure the quality of dielectric materials.
Intermittent Operating Life (IOL) testing is used to determine the reliability of devices, most commonly used on power electronics.
Insulation Resistance (IR) testing is used to measure the resistance of the insulating material of a component.
Optoelectronic Testing is used to characterize or confirm the properties of an optoelectronic device. This could include optical output power testing.
Semiconductor Parametric Testing includes electrical testing of active devices in non-production quantities.
