1 (855) ORS-LABS
For general inquiries contact Krista Vivenzo
(315) 736-5480 ext. 2231
IVA®, HR-IVA® and HSHLD® are registered trademarks of Oneida Research Inc.
Oneida Rad™ is a trademark of Oneida Research Services, Inc.
8282 Halsey Road
Whitesboro, NY 13492 USA
8811 American Way, Suite 100
Englewood, CO 80112 USA
Oneida Recherche Services
06903 SOPHIA ANTIPOLIS Cedex
4201 Pottsville Pike
Reading, PA 19605 USA
Oneida Research Services Acquires IGA Division From Atlantic Analytical Laboratory
WHITESBORO, New York: Oneida Research Services, Inc. (ORS) announces the acquisition of the Internal Gas Analysis (IGA) division of Atlantic Analytical Laboratory (AAL). IGA is a critical test for qualifying electronic components for military, space, telecom and medical applications. The analytical technique is a quantitative measurement of sealed gases to ensure that high-reliability electronic components do not contain moisture or other gases that may cause premature product failure.
Ensuring mission-critical component success with DPA testing
Destructive Physical Analysis (DPA) is essential used primarily for testing for the viability of mission-critical aerospace and military equipment. It’s a series of methods that involves thoroughly examining electronic components such as microcircuits and semiconductors to uncover construction deviations and workmanship anomalies. When lives are on the line or failure is not an option, DPA testing is an essential step that serves as final audit.
ORS Acquires New Analytical Testing Equipment
As part of its ongoing commitment to offering state-of-the-art analytical testing services, ORS has acquired two new pieces of advanced laboratory testing equipment including:
– X-Ray Fluorescence (XRF) Bench Top System a P series Bowman Model # BA-100
– OKOS VUE 250-P Scanning Acoustic Microscope
Custom system, bench top unit designed to handle full JEDEC tray submissions.
Preventing Moisture Failures in Sealed Electronic Devices
Moisture is a pervasive and existential threat to the performance of all microelectronic products. It can undermine the efficiency and dependability of mission-critical devices in your customers’ systems. In hermetically sealed microelectronic devices, the presence of any moisture, whether evolved from package materials or due to leakage – no matter how small – can cause component failure or malfunction.
ORS Acquires Silicon Cert Laboratories
ORS Labs, Inc., the parent company of Oneida Research Services, Inc. (ORS), announces the acquisition of Silicon Cert Laboratories in Reading, Pennsylvania. Silicon Cert Laboratories is an internationally recognized leader in environmental and mechanical testing and qualification of products and components for the telecommunications, defense, automotive, aerospace and medical-device industries. Silicon Cert Laboratories testing services include mechanical shock, vibration, drop testing and environmental exposure such as temperature and humidity cycling to evaluate the impact of changing environmental conditions on products.
ORS manufactures the HSHLD™ Model 310 High Sensitivity Helium Leak Detection System
Using a Quadrupole Mass Spectrometer system for High Sensitivity Helium Leak Rate measurement to qualify your product to the latest, tighter leak rate requirements, our HSHLD™ Model 310 exceeds the capabilities of conventional mass spectrometer helium leak test technology. This new system gives you enhanced spectrometer sensitivity at a modest cost. The system is modular, automated, flexible, fast, easy to calibrate, easy to use, and is affordable. Both the FINE and GROSS leak test is performed in a single test sequence.
High Resolution Internal Vapor Analysis Services
ORS Inc. is pleased to announce the unveiling of its new HR-IVA Analyzer for testing very small volume packages. This new technology provides tremendous sensitivity to package volumes <0.01cc compared to standard Quadrupole techniques. In addition, ORS has developed innovative calibration techniques that use all metal seals for volumes ranging from 0.01cc to 1nl (1X10-6cc). A presentation at Aerospace Corporation’s Space Parts Working Group on April 4th, 2006 provides a summary of the technique, sensitivity and its unmatched acquisition speed of 20µs per Full Mass Range Scan (2 - >150 AMU).