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ORS Laboratories are ISO 9001:2015 and AS9100D Certified| 1 (855) ORS-LABS
Oneida Research Services, Inc.
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    • Package Gas Analysis (RGA Testing)
      • HR-IVA® (High Resolution IVA Testing)
      • IVA® (Internal Vapor Analysis)
      • Gas Sampling Cylinder Analysis
      • Organic Mass Spectrometry – GC/MS
      • Delta-P Getter Sorption Qualification Testing
    • Hermeticity Testing
      • HSHLD® (High Sensitivity Helium Leak Detection)
      • Krypton-85 Fine and Gross Leak Testing
      • Helium Fine Leak Hermeticity Testing
      • Gross Leak Hermeticity Testing Processes
      • Leak Site Identification
      • Implanted Medical Devices
    • Material Outgassing Analysis
      • Material Outgassing Studies
      • UHV-EGA (Ultra-High Vacuum Evolved Gas Analysis)
      • ASTM E595 Outgassing Testing
      • Thermal Gravimetric Analysis-Mass Spectrometry (TGA-MS)
      • RGA Outgassing and Cleanliness Qualification Testing
    • PCB Testing
      • IPC-A-600 Inspection
      • IPC-TM-650 A/B and D Coupon Testing
      • IPC-TM-650 Thermal Stress, Plated-Through Holes
      • SIR & ECM Testing
    • Component Analysis
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      • Micro FT-IR Spectroscopy
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      • X-Ray Fluorescence Elemental Analysis
    • Environmental Testing
      • Accelerated Bias Aging
      • Autoclave Testing
      • Cyclic Moisture Resistance
      • Highly Accelerated Stress Test (HAST)
      • Moisture Sensitivity Level Testing (MSL)
      • Preconditioning Test
      • Salt Atmosphere Testing
      • Steam Aging
      • Temperature Cycling Testing
      • Temperature Humidity Testing
      • Temperature Storage Testing
      • Thermal Shock Testing
    • Mechanical Testing
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      • Fiber Integrity Testing
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      • Solderability Testing
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      • Variable Frequency Vibration Testing
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      • Intermittent Operating Life (IOL)
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      • Dielectric Withstanding Voltage (DWV)
      • Semiconductor Parametric Testing
      • Capacitance and Dissipation Factor (C&DF)
      • Optoelectronic Testing
  • Instrument Sales & Service
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High Sensitivity Helium Leak Detection (HSHLD®)

Our test method is DLA approved for Mil-Std 750 and 883

Our High Sensitivity Helium Leak Detection System (HSHLD®) Model 310 is an ideal way to qualify your product to the new, tighter leak rate requirements. HSHLD® testing is able to provide both FINE and GROSS leak test data in a single test sequence. Devices are typically preconditioned in a pressurized chamber and, after the required conditions are met, the leak rate is measured and recorded.

HSHLD® High Sensitivity Helium Leak Detection – Model 310

HSHLD Model 310

Find out about doing your own leak-rate testing in-house.

See Product Page ›

Specifications:

    • Helium Tracer Gas
    • Pressurization range: 30-95 psia
    • Minimum detection limit: <1 x 10-12 atm cc/sec He
    • Measurement method: Batch Testing or Read and Record
    • NY and CO Laboratories hold DLA Suitability for:
      • Mil-Std 750 method 1071 condition H1, H2 and H3
      • Mil-Std 883 method 1014 condition A1, A2 and A5
    • Accurate R1 measurements verified by a 2 point linear calibration.
    • No Fluorocarbons Required

Helium hermeticity testing can be modified to suit the testing requirements of your device. We have assisted many clients in creating a custom leak test plan based on their needs.

Expanded Fine Leak for Other Gases and Compounds

Specialized leak testing is available for determining leak rates for gases other than helium. Leak rates of various gases (i.e. Argon, CO2, Acetic Acid, Ethylene Glycol, etc.) may be measured at low leak rates utilizing a specialized mass spectrometer tuned for the particular substance of interest. Applicable standards are normally available in a wide range of leak rates.

Request an HSHLD® Demo or Follow-Up Call

Our HSHLD® system exceeds the most stringent requirements for measuring leak rates of helium and most other gases. We can run the tests for you or you can do them in-house using our equipment. Let us show you how easy it is!

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    • Device Types
    • Large Hybrid Packages
    • IC, Crystals, Relays, Transistor Packages
    • Xenon/Krypton filled lamps
    • Batteries
    • Laser Components
    • Automotive Packages/Sensors
    • Medical packages (pacemakers, cochlear implants, etc)
    • Pressurized cylinders
    • Other unique applications
    • Mechanical Testing
      • Constant Acceleration Testing
      • Fiber Integrity Testing
      • Mechanical Shock Testing
      • Particle Impact Noise Detection (PIND)
      • Physical Dimension Testing
      • Random Vibration Testing
      • Resistance to Solvents Testing
      • Semiconductor Parametric Testing and Characterization
      • Solder Heat Resistance Test (SHRT)
      • Solderability Testing
      • Transportation Testing
      • Variable Frequency Vibration Testing
    • Organic Mass Spectrometry
    • Package Gas Analysis (RGA)
      • IVA® (Internal Vapor Analysis)
      • HR-IVA® (High Resolution IVA® Testing)
      • Delta-P Getter Sorption Qualification Testing
      • Gas Sampling Cylinder Analysis
    • Component Analysis
      • Micro FT-IR Spectroscopy
      • Scanning Electron Microscopy (SEM) Inspection
      • X-Ray Fluorescence Elemental Analysis
      • Destructive Physical Analysis (DPA)
        • Destructive Physical Analysis (DPA) Testing for Capacitors
        • Destructive Physical Analysis (DPA) Testing for Crystals
        • Destructive Physical Analysis (DPA) Testing for Diodes
        • Destructive Physical Analysis (DPA) Testing for Filters
        • Destructive Physical Analysis (DPA) Testing for Fuses
        • Destructive Physical Analysis (DPA) Testing for Hybrid Microcircuits
        • Destructive Physical Analysis (DPA) Testing for Microcircuits
        • Destructive Physical Analysis (DPA) Testing for PEMS
        • Destructive Physical Analysis (DPA) Testing for Relays
        • Destructive Physical Analysis (DPA) Testing for Resistors
        • Destructive Physical Analysis (DPA) Testing for Thermistors
        • Destructive Physical Analysis (DPA) Testing for Transistors
        • Destructive Physical Analysis (DPA) Testing of Magnetic Components
      • Construction Analysis
      • Failure Analysis (FA)
      • Acid Decapsulation of Electronic Components
      • Ion Milling
      • Acoustic Microscopy
      • Steam Aging / Solderability
    • Hermeticity Testing
      • HSHLD® (High Sensitivity Helium Leak Detection)
      • Krypton-85 Fine and Gross Leak Testing
      • Helium Fine Leak Hermeticity Testing
      • Gross Leak Hermeticity Testing Processes
      • Leak Site Identification
      • Implanted Medical Devices
    • Electrical Testing
    • Material Outgassing Analysis
      • ASTM E595 Outgassing Services
      • RGA Outgassing and Cleanliness Qualification Services
      • Thermal Gravimetric Analysis-Mass Spectrometry (TGA-MS)
      • Ultra-High Vacuum Evolved Gas Analysis
      • Material Outgassing Studies
    • PCB Testing
      • Printed Circuit Board Inspection Services
      • SIR & ECM Testing
      • IPC-TM-650 A/B and D Coupon Testing
      • IPC-TM-650 Thermal Stress Testing
    • Capacitance and Dissipation Factor (C&DF)
    • Dielectric Withstanding Voltage (DWV)
    • Insulation Resistance (IR)
    • Intermittent Operating Life (IOL)
    • Optoelectronic Testing
    • Destructive Physical Analysis (DPA) Testing for Connectors
    • Environmental Testing
      • Accelerated Bias Aging Test
      • Autoclave Testing
      • Cyclic Moisture Resistance
      • Highly Accelerated Stress Test (HAST)
      • Moisture Sensitivity Level Testing (MSL)
      • Salt Atmosphere Testing
      • SMD Preconditioning Test
      • Steam Aging
      • Temperature Cycling Testing
      • Temperature Humidity Testing
      • Temperature Storage Testing
      • Thermal Shock Testing
    • X-Ray Inspection
      • X-Ray Computed Tomography (CT)
    • Consulting Services

    Test Submission Forms

    Component Form - NY
    Component Form - CO
    Material Outgassing Form - NY
    Mech/Environmental Form - PA
    PCB Coupon Form - CO
    RGA/Hermeticity Form - NY
    RGA/Hermeticity Form - CO

    Testing Methods

    MIL-STD
    ASTM
    JEDEC
    IEC
    TELCORDIA
    ICP
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    Contact

    1 (855) ORS-LABS

    For general inquiries contact Krista Vivenzo

    kvivenzo@orslabs.com

    (315) 736-5480 ext. 2231

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    IVA®, HR-IVA® and HSHLD® are registered trademarks of Oneida Research Inc.
    Oneida Rad™ is a trademark of Oneida Research Services, Inc.

    New York

    Corporate Headquarters
    8282 Halsey Road
    Whitesboro, NY 13492 USA

    (315) 736-5480

    New York Office: DLA Suitability Letter

    Component Submission Form (NY)
    RGA/Hermeticity Submission Form (NY)
    Material Outgassing Submission Form (NY)

    Colorado

    8811 American Way, Suite 100
    Englewood, CO 80112 USA

    1 (855) ORS-LABS

    Colorado Office: DLA Suitability Letter

    Component Submission Form (CO)
    RGA/Hermeticity Submission Form (CO)
    PCB Coupon Submission Form (CO)

    France

    Oneida Recherche Services

    BP 163
    06903 SOPHIA ANTIPOLIS Cedex
    FRANCE

    +33 4 92 92 88 89

    European Office: DLA Suitability Letter

    Pennsylvania

    4201 Pottsville Pike
    Suite 420
    Reading, PA 19605 USA

    1 (855) ORS-LABS

    Pennsylvania Office: DLA Suitability Letter

    Mech/Enviro Submission Form (PA)

    Tools

    Howl-Mann Equation
    Oneida Rad™ Equation (Kr-85)
    Moisture Calculator
    Moisture Graph
    Gas Evolution in Leaking Package
    Solving for Oxygen Exchange Rate

    Certification

    ISO 9001:2015 & AS9100D Certified

    ISO/IEC 17025:2017 Accredited

    PJR Certification A2LA logo
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