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ORS Laboratories are ISO 9001:2015 and AS9100D Certified| 1 (855) ORS-LABS
Oneida Research Services, Inc.
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    • Package Gas Analysis (RGA Testing)
      • HR-IVA® (High Resolution IVA Testing)
      • IVA® (Internal Vapor Analysis)
      • Gas Sampling Cylinder Analysis
      • Organic Mass Spectrometry – GC/MS
      • Delta-P Getter Sorption Qualification Testing
    • Hermeticity Testing
      • HSHLD® (High Sensitivity Helium Leak Detection)
      • Krypton-85 Fine and Gross Leak Testing
      • Helium Fine Leak Hermeticity Testing
      • Gross Leak Hermeticity Testing Processes
      • Leak Site Identification
      • Implanted Medical Devices
    • Material Outgassing Analysis
      • Material Outgassing Studies
      • UHV-EGA (Ultra-High Vacuum Evolved Gas Analysis)
      • ASTM E595 Outgassing Testing
      • Thermal Gravimetric Analysis-Mass Spectrometry (TGA-MS)
      • RGA Outgassing and Cleanliness Qualification Testing
    • PCB Testing
      • IPC-A-600 Inspection
      • IPC-TM-650 A/B and D Coupon Testing
      • IPC-TM-650 Thermal Stress, Plated-Through Holes
      • SIR & ECM Testing
    • Component Analysis
      • Destructive Physical Analysis (DPA)
      • Construction Analysis
      • Failure Analysis (FA)
      • Ion Milling
      • Acoustic Microscopy
      • Real Time X-Ray
      • 3D CT X-Ray
      • Acid Decapsulation of Electronic Components
      • Micro FT-IR Spectroscopy
      • Scanning Electron Microscopy (SEM) Inspection
      • X-Ray Fluorescence Elemental Analysis
    • Environmental Testing
      • Accelerated Bias Aging
      • Autoclave Testing
      • Cyclic Moisture Resistance
      • Highly Accelerated Stress Test (HAST)
      • Moisture Sensitivity Level Testing (MSL)
      • Preconditioning Test
      • Salt Atmosphere Testing
      • Steam Aging
      • Temperature Cycling Testing
      • Temperature Humidity Testing
      • Temperature Storage Testing
      • Thermal Shock Testing
    • Mechanical Testing
      • Constant Acceleration Testing
      • Fiber Integrity Testing
      • Mechanical Shock Testing
      • Particle Impact Noise Detection (PIND)
      • Physical Dimension Testing
      • Random Vibration Testing
      • Resistance to Solvents Testing
      • Solder Heat Resistance Test (SHRT)
      • Solderability Testing
      • Transportation Testing
      • Variable Frequency Vibration Testing
    • Electrical Testing
      • Intermittent Operating Life (IOL)
      • Insulation Resistance (IR)
      • Dielectric Withstanding Voltage (DWV)
      • Semiconductor Parametric Testing
      • Capacitance and Dissipation Factor (C&DF)
      • Optoelectronic Testing
  • Instrument Sales & Service
    • IVA® Model 210s Internal Vapor Analyzer
    • HSHLD® Model 310 High Sensitivity Helium Leak Detection System
    • Delta-P Model 410 Getter Sorption Analyzer
    • UHV-EGA Model 510 Ultra-High Vacuum Evolved Gas Analyzer
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News

INFICON Expands Global Partnership with Oneida Research Services to Ensure Long-Term Customer Support

March 4, 2026/by ORS Labs

INFICON GmbH and Oneida Research Services, Inc. (ORS) are pleased to announce the global expansion of a partnership originally established to guarantee continued service and support for the CHLD Pernicka 700H helium leak detector.

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ORS to Support INFICON’s Cumulative Helium Leak Detector

October 22, 2024/by ORS Labs

October 22, 2024 – We are pleased to announce that INFICON, Inc. (INFICON) and Oneida Research Services, Inc. (ORS) have entered into an arrangement for ORS to support INFICON’s cumulative helium leak detector (Pernicka 700H).

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chipsID and Oneida Research Services Announce Strategic Collaboration to Combat Counterfeit Microelectronics

September 6, 2024/by ORS Labs

Whitesboro, NY – September 4, 2024 – chipsID, a pioneering startup specializing in creating and managing a growing database of golden samples to support prevention and mitigation of counterfeit electronic components, and Oneida Research Services (ORS), a leader in microelectronics testing, have announced a strategic collaboration aimed at enhancing the integrity and reliability of electronic components in critical industries.

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Oneida Research Services Acquires IGA Division From Atlantic Analytical Laboratory

June 14, 2021/by ORS Labs

WHITESBORO, New York: Oneida Research Services, Inc. (ORS) announces the acquisition of the Internal Gas Analysis (IGA) division of Atlantic Analytical Laboratory (AAL). IGA is a critical test for qualifying electronic components for military, space, telecom and medical applications. The analytical technique is a quantitative measurement of sealed gases to ensure that high-reliability electronic components do not contain moisture or other gases that may cause premature product failure.

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ORS Acquires New Analytical Testing Equipment

July 17, 2019/by ORS Labs

As part of its ongoing commitment to offering state-of-the-art analytical testing services, ORS has acquired two new pieces of advanced laboratory testing equipment including:

– X-Ray Fluorescence (XRF) Bench Top System a P series Bowman Model # BA-100
– OKOS VUE 250-P Scanning Acoustic Microscope
Custom system, bench top unit designed to handle full JEDEC tray submissions.

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ORS Acquires Silicon Cert Laboratories

April 16, 2018/by ORS Labs

ORS Labs, Inc., the parent company of Oneida Research Services, Inc. (ORS), announces the acquisition of Silicon Cert Laboratories in Reading, Pennsylvania. Silicon Cert Laboratories is an internationally recognized leader in environmental and mechanical testing and qualification of products and components for the telecommunications, defense, automotive, aerospace and medical-device industries. Silicon Cert Laboratories testing services include mechanical shock, vibration, drop testing and environmental exposure such as temperature and humidity cycling to evaluate the impact of changing environmental conditions on products.

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ORS manufactures the HSHLD™ Model 310 High Sensitivity Helium Leak Detection System

March 1, 2016/by ORS Labs

Using a Quadrupole Mass Spectrometer system for High Sensitivity Helium Leak Rate measurement to qualify your product to the latest, tighter leak rate requirements, our HSHLD™ Model 310 exceeds the capabilities of conventional mass spectrometer helium leak test technology. This new system gives you enhanced spectrometer sensitivity at a modest cost. The system is modular, automated, flexible, fast, easy to calibrate, easy to use, and is affordable. Both the FINE and GROSS leak test is performed in a single test sequence.

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High Resolution Internal Vapor Analysis Services

March 1, 2011/by ORS Labs

ORS Inc. is pleased to announce the unveiling of its new HR-IVA Analyzer for testing very small volume packages. This new technology provides tremendous sensitivity to package volumes <0.01cc compared to standard Quadrupole techniques. In addition, ORS has developed innovative calibration techniques that use all metal seals for volumes ranging from 0.01cc to 1nl (1X10-6cc). A presentation at Aerospace Corporation’s Space Parts Working Group on April 4th, 2006 provides a summary of the technique, sensitivity and its unmatched acquisition speed of 20µs per Full Mass Range Scan (2 - >150 AMU).

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Did you know…..?

ORS offers Reflow Soldering and Moisture Sensitivity (JEDEC J-STD-020C) analytical capabilities on devices intended for Surface Mount Technology applications.

Solder Reflow and Moisture Sensitivity Testing Services (JEDEC J-STD-020C) provide ORS clients the ability to subject components to a controlled introduction to moisture followed by board-level temperature cycling to evaluate the effects of Pb free processes. The calibrated seven-zone convection/conduction oven provides precise control over reflow processes and simulations ensuring that devices are not unduly exposed to thermal stress and that all packages can be successfully and reliably surface mounted. Sample preconditioning by on-site temperature and humidity chambers enables ORS to introduce moisture to non-hermetic packages. Following pre-conditioning, moisture sensitivity of the device can be evaluated by post-reflow reliability testing (ie. X-ray, C-SAM). Profiles used at ORS are based on JEDEC standards to ensure quality solder connections for all types of SMT packages.

The acquisition of this technique in addition to other analytical methods such as real-time x-ray, scanning acoustic microscopy and electrical testing establishes ORS as an equipped leader in the component analysis industry.

ORS has 3D Capability

X-Ray Computed Tomography (CT), commonly referred to as 3-D imaging, is a computer model generated from multiple 2-D X ray images. ORS currently has two CT systems with different design and capabilities to accommodate a broad range of samples sizes and configurations.

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For general inquiries contact Krista Vivenzo

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(315) 736-5480 ext. 2231

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New York

Corporate Headquarters
8282 Halsey Road
Whitesboro, NY 13492 USA

(315) 736-5480

New York Office: DLA Suitability Letter

Component Submission Form (NY)
RGA/Hermeticity Submission Form (NY)
Material Outgassing Submission Form (NY)

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8811 American Way, Suite 100
Englewood, CO 80112 USA

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Colorado Office: DLA Suitability Letter

Component Submission Form (CO)
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+33 4 92 92 88 89

European Office: DLA Suitability Letter

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4201 Pottsville Pike
Suite 420
Reading, PA 19605 USA

1 (855) ORS-LABS

Pennsylvania Office: DLA Suitability Letter

Mech/Enviro Submission Form (PA)

Tools

Howl-Mann Equation
Oneida Rad™ Equation (Kr-85)
Moisture Calculator
Moisture Graph
Gas Evolution in Leaking Package
Solving for Oxygen Exchange Rate

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