Oneida Research Services Acquires IGA Division From Atlantic Analytical Laboratory

WHITESBORO, New York: Oneida Research Services, Inc. (ORS) announces the acquisition of the Internal Gas Analysis (IGA) division of Atlantic Analytical Laboratory (AAL). IGA is a critical test for qualifying electronic components for military, space, telecom and medical applications. The analytical technique is a quantitative measurement of sealed gases to ensure that high-reliability electronic components do not contain moisture or other gases that may cause premature product failure.

ORS Acquires New Analytical Testing Equipment

As part of its ongoing commitment to offering state-of-the-art analytical testing services, ORS has acquired two new pieces of advanced laboratory testing equipment including:

– X-Ray Fluorescence (XRF) Bench Top System a P series Bowman Model # BA-100
– OKOS VUE 250-P Scanning Acoustic Microscope
Custom system, bench top unit designed to handle full JEDEC tray submissions.

ORS Acquires Silicon Cert Laboratories

ORS Labs, Inc., the parent company of Oneida Research Services, Inc. (ORS), announces the acquisition of Silicon Cert Laboratories in Reading, Pennsylvania. Silicon Cert Laboratories is an internationally recognized leader in environmental and mechanical testing and qualification of products and components for the telecommunications, defense, automotive, aerospace and medical-device industries. Silicon Cert Laboratories testing services include mechanical shock, vibration, drop testing and environmental exposure such as temperature and humidity cycling to evaluate the impact of changing environmental conditions on products.

ORS manufactures the HSHLD™ Model 310 High Sensitivity Helium Leak Detection System

Using a Quadrupole Mass Spectrometer system for High Sensitivity Helium Leak Rate measurement to qualify your product to the latest, tighter leak rate requirements, our HSHLD™ Model 310 exceeds the capabilities of conventional mass spectrometer helium leak test technology. This new system gives you enhanced spectrometer sensitivity at a modest cost. The system is modular, automated, flexible, fast, easy to calibrate, easy to use, and is affordable. Both the FINE and GROSS leak test is performed in a single test sequence.

High Resolution Internal Vapor Analysis Services

ORS Inc. is pleased to announce the unveiling of its new HR-IVA Analyzer for testing very small volume packages. This new technology provides tremendous sensitivity to package volumes <0.01cc compared to standard Quadrupole techniques. In addition, ORS has developed innovative calibration techniques that use all metal seals for volumes ranging from 0.01cc to 1nl (1X10-6cc). A presentation at Aerospace Corporation’s Space Parts Working Group on April 4th, 2006 provides a summary of the technique, sensitivity and its unmatched acquisition speed of 20µs per Full Mass Range Scan (2 - >150 AMU).

Did you know…..?

ORS offers Reflow Soldering and Moisture Sensitivity (JEDEC J-STD-020C) analytical capabilities on devices intended for Surface Mount Technology applications.

Solder Reflow and Moisture Sensitivity Testing Services (JEDEC J-STD-020C) provide ORS clients the ability to subject components to a controlled introduction to moisture followed by board-level temperature cycling to evaluate the effects of Pb free processes. The calibrated seven-zone convection/conduction oven provides precise control over reflow processes and simulations ensuring that devices are not unduly exposed to thermal stress and that all packages can be successfully and reliably surface mounted. Sample preconditioning by on-site temperature and humidity chambers enables ORS to introduce moisture to non-hermetic packages. Following pre-conditioning, moisture sensitivity of the device can be evaluated by post-reflow reliability testing (ie. X-ray, C-SAM). Profiles used at ORS are based on JEDEC standards to ensure quality solder connections for all types of SMT packages.

The acquisition of this technique in addition to other analytical methods such as real-time x-ray, scanning acoustic microscopy and electrical testing establishes ORS as an equipped leader in the component analysis industry.

ORS has 3D Capability

X-Ray Computed Tomography (CT), commonly referred to as 3-D imaging, is a computer model generated from multiple 2-D X ray images. ORS currently has two CT systems with different design and capabilities to accommodate a broad range of samples sizes and configurations.